Organizers:

Representative

Co-Organizers

Correspondence

Scope:

In many applications such as fuel cells, batteries and superconductors, most of the key properties are linked to the nanostructure of their constituent materials. Any attempt at the tuning of this nanostructure in order to optimize the application properties, however, requires the ability to extract the morphological details on length scales ranging from the sub-nm scale up to the micron scale. Moreover, since the application properties are defined by the average of the bulk material, the statistically representative characterization of the average nanostructure is a necessity.

Small-angle scattering (of light, X-rays, and neutrons) is a unique nanostructural characterization technique capable of obtaining exactly this; providing average morphological parameters over volumes ranging from cubic micrometers to cubic centimeters. The widespread adoption of this technique, however, has been hindered by a complicated data interpretation as well as instrumental limitations.

Recently, much progress has been made enabling advanced generation, focusing and detection of both X-rays and neutrons, widening the application of the technique. Further advances in data interpretation significantly reduce the time and expertise needed for obtaining useful information.

During this session, applications of small-angle scattering to materials science and engineering, as well as instrumentation and data interpretation will be addressed.

Topics:

• Application of the SAS to fuel cell, secondary batteries, super conductors and the structural materials
• Focusing technique, detector and new technology for SANS/SAXS measurements
• Small Neutron Source for SANS
• In-situ experiment of SANS and SAXS
• Analysis of SAS